J Campos, J Fontecha, A Pons (Consejo Superior de Investigaciones Científicas) A Hanson, D Williams, J Verrill (National Physical Laboratory)
Metrologia, vol. 37, pp. 323-327
A comparison of two different scales of regular reflectance measurements has been made between the National Physical Laboratory (NPL, UK) and the Consejo Superior de Investigaciones Científicas (CSIC, Spain). Both laboratories have spectrally calibrated a reflectance transfer standard at angles of incidence of 8° and 45° in the wavelength range 350 nm to 1000 nm. Relative differences in reflectance are between 2 parts in 103 and -2 parts in 103 at 8°, and between 1 part in 103 and -4 parts in 103 at 45°. These results agree well within their respective uncertainties.
